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McBride, R. D. ; Stygar, W. A. ; Cuneo, M. E. ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2018

In: IEEE Transactions on Plasma Science Vol. 46, No. 11 ( 2018-11), p. 3928-3967

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In: IEEE Transactions on Plasma Science, Institute of Electrical and Electronics Engineers (IEEE), Vol. 46, No. 11 ( 2018-11), p. 3928-3967

Type of Medium: Online Resource

ISSN: 0093-3813 , 1939-9375

URL: Article

DOI: 10.1109/TPS.2018.2870099

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2018

detail.hit.zdb_id: 2025402-7

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