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Jiang, He ; Li, Xiaochen ; Ren, Zhilei ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2019

In: IEEE Transactions on Reliability Vol. 68, No. 1 ( 2019-3), p. 2-22

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In: IEEE Transactions on Reliability, Institute of Electrical and Electronics Engineers (IEEE), Vol. 68, No. 1 ( 2019-3), p. 2-22

Type of Medium: Online Resource

ISSN: 0018-9529 , 1558-1721

URL: Journal

URL: Article

DOI: 10.1109/TR.24

DOI: 10.1109/TR.2018.2873427

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2019

detail.hit.zdb_id: 2034315-2

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