In:
Journal of the American Ceramic Society, Wiley, Vol. 97, No. 12 ( 2014-12), p. 3872-3876
Abstract:
Nanograined PbTiO 3 ( PT ) thick films were deposited on Si , yttria‐stabilized zirconia ( YSZ ), and Ni substrates using an aerosol deposition ( AD ) method at room temperature. The AD PT thick films on each different substrate were annealed at 500°C and 700°C for 1 h to increase the crystallinity. The stresses in the PT film were modulated by controlling the difference in the coefficient of thermal expansion ( CTE ) between the films and substrates during the thermal annealing process. The morphology of the AD PT films was examined from the polycrystalline dense structure (thickness ~8 μm), and the changes in the crystallographic phase, in‐plane stresses, and ferroelectric properties in annealed films were investigated. In‐plane stress analysis showed that the PT films annealed at 500°C and 700°C on each substrate exhibited compressive stress. Owing to the effects of compressive stress in the PT film, the film showed less tetragonality ( c / a ratio) and enhanced ferroelectric behaviors. The change in the polarization–electric field ( P–E ) hysteresis loop of the PT films was explained by the stress induced from CTE mismatch between the films and substrates.
Type of Medium:
Online Resource
ISSN:
0002-7820
,
1551-2916
DOI:
10.1111/jace.2014.97.issue-12
Language:
English
Publisher:
Wiley
Publication Date:
2014
detail.hit.zdb_id:
2008170-4
detail.hit.zdb_id:
219232-9