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    Online Resource
    Online Resource
    American Vacuum Society ; 2001
    In:  Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films Vol. 19, No. 3 ( 2001-05-01), p. 952-957
    In: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, American Vacuum Society, Vol. 19, No. 3 ( 2001-05-01), p. 952-957
    Abstract: Epitaxial W/NbN superlattices with modulation wavelengths Λ ranging from 1.3 to 25 nm were grown on MgO(001) substrates by dc reactive magnetron sputtering in Ar/N2 mixtures. The epitaxial relationship between the layers is given by W(001)‖NbN(001) and W[110]‖NbN[100] . X-ray diffraction and Rutherford backscattering results fitted using simulations showed that the superlattices had well-defined planar layers with interface widths of ≈0.2 nm. Nanoindentation measurements showed superlattice hardnesses as high as 33 GPa compared to 8 for W and 20 for NbN. The superlattices showed little change in x-ray superlattice reflections or nanoindentation hardness after vacuum annealing up to the highest temperature tested, 1000 °C for 6 h. Thus, the layers remained intact during annealing, allowing the superlattice hardness enhancement to be retained.
    Type of Medium: Online Resource
    ISSN: 0734-2101 , 1520-8559
    RVK:
    Language: English
    Publisher: American Vacuum Society
    Publication Date: 2001
    detail.hit.zdb_id: 1475424-1
    detail.hit.zdb_id: 797704-9
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