In:
Surface Science Spectra, American Vacuum Society, Vol. 24, No. 2 ( 2017-12-01)
Kurzfassung:
Time-of-flight secondary ion mass spectrometry was carried out to analyze a commercially available ethanedioic acid (oxalic acid) powder. Positive and negative polarity ion spectra were obtained using a 25 keV Bi3+ ion beam rastered over areas of 50 × 50 μm2. The main observed ions were the protonated molecule [M+H]+ at 91 Da and the deprotonated molecule [M-H] − at 89 Da with their respective oligomers.
Materialart:
Online-Ressource
ISSN:
1055-5269
,
1520-8575
DOI:
10.1116/1.5004981.sm
DOI:
10.1116/1.5004981.N141301
DOI:
10.1116/1.5004981.N141302
Sprache:
Englisch
Verlag:
American Vacuum Society
Publikationsdatum:
2017
ZDB Id:
2008474-2
SSG:
11