In:
Genome, Canadian Science Publishing, Vol. 60, No. 3 ( 2017-03), p. 208-215
Abstract:
Gene loss during the formation of hexaploid bread wheat has been repeatedly reported. However, our knowledge on genome-wide analysis of the genes present on a single subgenome (SSG) in bread wheat is still limited. In this study, by analysing the ‘Chinese Spring’ chromosome arm shotgun sequences together with high-confidence gene models, we detected 433 genes on a SSG. Greater gene loss was observed in A and D subgenomes compared with B subgenome. More than 79% of the orthologs for these SSG genes were detected in diploid and tetraploid relatives of hexaploid wheat. Unexpectedly, no bias in expression breadth or in the distribution patterns of GO (gene ontology) terms for these genes was detected among the high-confidence genes. Further, network and KEGG (Kyoto Encyclopedia of Genes and Genomes) pathway analyses indicated that most of these genes were not functionally related to each other. Interestingly, 30.7% of these SSG genes were most highly expressed in root, showing biased distribution given the distribution of the whole high-confidence genes. Collectively, these results facilitate our understanding of the loss of the genes that were retained in a SSG during the formation of hexaploid wheat.
Type of Medium:
Online Resource
ISSN:
0831-2796
,
1480-3321
DOI:
10.1139/gen-2016-0076
Language:
English
Publisher:
Canadian Science Publishing
Publication Date:
2017
detail.hit.zdb_id:
2020635-5
SSG:
12
