In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 31, No. 5R ( 1992-05-01), p. 1441-
Kurzfassung:
The apparent surface corrugation of highly oriented pyrolytic graphite (HOPG) was investigated with a scanning tunneling microscope (STM) in air using mechanically polished PtIr tips. It was found that the tunneling resistance was the most dominant parameter governing the observed atomic corrugation. The tunneling resistance was defined by the ratio of bias voltage to tunneling current required for STM measurements. The maximum corrugation of about 0.3 nm was attained at the tunneling resistance around 10 7 Ω. The dependence of the corrugation upon tunneling resistance is qualitatively explained taking into account the variation of tip function, by means of both the elastic deformation of the sample surface and the separation change of the tip and surface.
Materialart:
Online-Ressource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.31.1441
Sprache:
Unbekannt
Verlag:
IOP Publishing
Publikationsdatum:
1992
ZDB Id:
218223-3
ZDB Id:
797294-5
ZDB Id:
2006801-3
ZDB Id:
797295-7