In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 34, No. 6S ( 1995-06-01), p. 3336-
Abstract:
A method of observing interfaces using scanning tunneling microscopy and atomic force microscopy is proposed, and the method is applied to observe interfaces between Pt film and Si(111) substrate, and the Pt/Si interface topography is clearly presented. Microstructures of interface such as band structure, island structure and netlike structure are described in detail. Finally, the reaction path at Pt/Si interface is discussed.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.34.3336
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
1995
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7