In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 34, No. 7A ( 1995-07-01), p. L859-
Abstract:
Nanometer-scale domain structures of organic molecules were fabricated on the SiO 2 substrates. The electric charges were injected into the single domain by the contact electrification process using a tip of Atomic Force Microscope. We observed the charge distribution by mapping the surface potential two-dimensionally, and found that the injected charges were stably stored in the isolated domain. The number of injected charges depended on the tip bias during contact, and we succeeded in injecting and imaging only a few elementary charges.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.34.L859
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
1995
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7