In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 35, No. 9S ( 1996-09-01), p. 5224-
Abstract:
Crystallization of precursor micropatterns of ferroelectric Bi 4 Ti 3 O 12 fabricated by electron beam scanning was investigated in comparison with that of thin films. Precursor solutions were prepared by mixing bismuth and titanium octylates with various
Bi : Ti molar ratios. Single-phase Bi 4 Ti 3 O 12 thin films were formed by spin-coating a solution containing Bi and Ti atoms at a molar ratio of 5.2 : 3.0 and successive heat treatment. It was possible to control orientation of the Bi 4 Ti 3 O 12 thin films by changing the sintering temperature. Bi 4 Ti 3 O 12 thin films consisting of platelike crystals with predominantly c -axis orientation were obtained by sintering at 800°C. Precursor micropatterns were fabricated by scanning an electron beam on metal octylate films and development with toluene. They were crystallized into single-phase Bi 4 Ti 3 O 12 by sintering at 800°C. However, the Bi 4 Ti 3 O 12 micropatterns consisted of small grains, unlike the large platelike crystals in thin films. There was a clear difference in crystallization between the thin films and the micropatterns.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.35.5224
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
1996
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7