In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 37, No. 5S ( 1998-05-01), p. 2823-
Kurzfassung:
Both the photoacoustic (PA) and the photoluminescence (PL) spectra were studied in porous Si.
The surface morphology was investigated using atomic force microscopy (AFM). The PA signal intensity was increased as porosity increased.
The enhancement of the PA signal intensity with an increase in the surface area was observed in samples whose porosity was above 60%. These surface effects were observed in AFM images.
We found a reciprocal correlation between the PA spectrum and the PL spectrum in the same sample. We also observed the reduction of the red spectrum in the PA spectra of the samples which showed a peak at 600 nm in the PL spectrum.
Materialart:
Online-Ressource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.37.2823
Sprache:
Unbekannt
Verlag:
IOP Publishing
Publikationsdatum:
1998
ZDB Id:
218223-3
ZDB Id:
797294-5
ZDB Id:
2006801-3
ZDB Id:
797295-7