In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 37, No. 1R ( 1998-01-01), p. 290-
Abstract:
Aluminum, arachidic acid (C 20 ) multilayered and/or 2-dodecyl-7,7,8,8-tetracyanoquinodimethane (C 12 TCNQ) multilayered Langmuir-Blodgett (LB) films, and aluminum were deposited successively on a substrate. The electric conductance in the interface direction of the upper-Al/C 12 TCNQ/C 20 /under-Al structure, upper-Al/C 20 /C 12 TCNQ structure, and other control structures was measured using the four-point probe method. The electric conductance in the interface direction of only the upper-Al/C 12 TCNQ/C 20 /under-Al structure with the number of deposited LB layers between 3 and 5 was 10 or 100 times larger than that of the control structures, including aluminum thin films.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
1998
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218223-3
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797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7