In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 38, No. 9S ( 1999-09-01), p. 5689-
Kurzfassung:
A new scanning nonlinear dielectric microscope with very high
resolution for the observation of ferroelectric polarization was developed. This microscope has a newly developed contact sensing mechanism for
detecting the exact contact point of a probe needle with respect to the surface of a specimen.
This contact sensing mechanism enables us to use a probe needle with a very thin pointed end.
Using the new microscope, domains in BaTiO 3 single crystal and in
PbTiO 3 thin film were observed.
By measuring the c-c domain wall of BaTiO 3 , the microscope was
confirmed to have nanometer-order resolution.
Materialart:
Online-Ressource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.38.5689
Sprache:
Unbekannt
Verlag:
IOP Publishing
Publikationsdatum:
1999
ZDB Id:
218223-3
ZDB Id:
797294-5
ZDB Id:
2006801-3
ZDB Id:
797295-7