In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 38, No. 12S ( 1999-12-01), p. 7247-
Kurzfassung:
The microprocesses of nanotubes such as attachment, connection, transfer and welding have been demonstrated using a scanning electron microscope. These processes led us to fabricate nanotube devices such as probes used in scanning probe microscopy and diodes with homojunctions or heterojunctions. A tapping-mode atomic force microscope with nanotube probes images the fine structures of biological and industrial specimens. The measurements of electrical properties of the diode devices with homojunctions show no considerable disturbance in the carrier transport and a high current density of ∼10 7 A/cm 2 without power dissipation in the diodes. A diode with a double barrier heterojunction exhibits a switching property with the onset voltage of ±1.9 V. These properties suggest that the nanotubes used in the diodes are semiconducting.
Materialart:
Online-Ressource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.38.7247
Sprache:
Unbekannt
Verlag:
IOP Publishing
Publikationsdatum:
1999
ZDB Id:
218223-3
ZDB Id:
797294-5
ZDB Id:
2006801-3
ZDB Id:
797295-7