In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 39, No. 5S ( 2000-05-01), p. 3086-
Kurzfassung:
The theory for quantitative measurement of linear and nonlinear dielectric constants using scanning nonlinear dielectric microscopy is explained in this paper.
Using this theory, quantitative measurements for linear and nonlinear dielectric constants of dielectric materials were performed successfully.
Materialart:
Online-Ressource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.39.3086
Sprache:
Unbekannt
Verlag:
IOP Publishing
Publikationsdatum:
2000
ZDB Id:
218223-3
ZDB Id:
797294-5
ZDB Id:
2006801-3
ZDB Id:
797295-7