In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 49, No. 6S ( 2010-06-01), p. 06GH10-
Kurzfassung:
We investigated the effect of an annealed ZnO buffer layer on the structural and optical properties of hydrothermally grown ZnO nanorods. ZnO buffer layers were deposited on a p-type Si(100) substrate by radio-frequency (RF) sputtering. ZnO nanorods were grown on as-deposited and annealed ZnO buffer layers by a hydrothermal process at a low temperature for various growth times. Annealed ZnO buffer layers have higher c -axis texturing than as-deposited ZnO buffer layer. ZnO nanorods grown on annealed ZnO buffer layers had higher X-ray diffraction (002) peak intensities and ultraviolet (UV) emission intensities than those grown on the as-deposited ZnO buffer layer. The degree of c -axis texturing of ZnO buffer layer affects the perpendicular growth for hydrothermal ZnO nanorod.
Materialart:
Online-Ressource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.49.06GH10
Sprache:
Unbekannt
Verlag:
IOP Publishing
Publikationsdatum:
2010
ZDB Id:
218223-3
ZDB Id:
797294-5
ZDB Id:
2006801-3
ZDB Id:
797295-7