In:
Advances in Condensed Matter Physics, Hindawi Limited, Vol. 2013 ( 2013), p. 1-6
Kurzfassung:
1 μ m-thick YBa 2 Cu 3 O 7 - δ (YBCO) films were grown on the Y 2 O 3 /yttria stabilized zirconia (YSZ)/CeO 2 buffer layers with different surface morphologies using direct-current sputtering. The critical current density ( J c ) value of YBCO was 1.1 MA/cm 2 when the root mean square surface roughness ( R rms ) of the buffer layer was 2.5 nm. As the R rms of the buffer layer increased to 15 nm, the J c decreased to 0.3 MA/cm 2 . X-ray diffraction and scanning electron microscopy showed the strong relevance of the evolution of the structure and surface morphologies of YBCO films with the buffer layer of different R rms . A model was proposed to explain the influence of surface morphology on the superconducting properties of YBCO films.
Materialart:
Online-Ressource
ISSN:
1687-8108
,
1687-8124
Sprache:
Englisch
Verlag:
Hindawi Limited
Publikationsdatum:
2013
ZDB Id:
2501251-4