In:
tm - Technisches Messen, Walter de Gruyter GmbH, Vol. 77, No. 9 ( 2010-09), p. 462-466
Abstract:
Optical systems for measuring three-dimensional surfaces are often too slow or too imprecise for inline inspection. That´s why Fraunhofer IPM has developed inspection systems based on multi-wavelength holography. Distinctive for their extremely short measuring times and high precision, the systems are suitable for 100 percent monitoring on production lines.
Type of Medium:
Online Resource
ISSN:
0171-8096
DOI:
10.1524/teme.2010.0049
Language:
English
Publisher:
Walter de Gruyter GmbH
Publication Date:
2010
detail.hit.zdb_id:
2025790-9
SSG:
15,3