In:
MRS Proceedings, Springer Science and Business Media LLC, Vol. 452 ( 1996)
Abstract:
Density of states changes in the valence and conduction band of silicon nanoclusters were monitored using soft x-ray emission and absorption spectroscopy as a function of cluster size. A progressive increase in the valence band edge toward lower energy is found for clusters with decreasing diameters. A similar but smaller shift is observed in the near-edge x-ray absorption data of the silicon nanoclusters.
Type of Medium:
Online Resource
ISSN:
0272-9172
,
1946-4274
DOI:
10.1557/PROC-452-171
Language:
English
Publisher:
Springer Science and Business Media LLC
Publication Date:
1996