In:
Crystals, MDPI AG, Vol. 12, No. 5 ( 2022-05-12), p. 691-
Abstract:
The strain profile in the subsurface of He-ion-irradiated W was figured out by unfolding the synchrotron-grazing incidence X-ray diffraction (S-GIXRD) patterns at different incidence angles. The results show that for 2 × 1021 ions/m2 He2+-irradiated W, in addition to a compressive strain exists in the depths of 0–100 nm due to mechanical polishing, an expansion strain appears in the depth beyond 100 nm owing to irradiation-induced lattice swelling. This work provides a reference for the study of irradiation damage in the subsurface by S-GIXRD.
Type of Medium:
Online Resource
ISSN:
2073-4352
DOI:
10.3390/cryst12050691
Language:
English
Publisher:
MDPI AG
Publication Date:
2022
detail.hit.zdb_id:
2661516-2