In:
Chinese Optics Letters, Shanghai Institute of Optics and Fine Mechanics, Vol. 11, No. 9 ( 2013), p. 091204-91206
Materialart:
Online-Ressource
ISSN:
1671-7694
Originaltitel:
Feasibility analysis of junction temperature measurement for GaN-based high-power white LEDs by the peak-shift method
DOI:
10.3788/COL/2013/11/9
DOI:
10.3788/COL201311.091204
Sprache:
Englisch
,
Chinesisch
Verlag:
Shanghai Institute of Optics and Fine Mechanics
Publikationsdatum:
2013