In:
Chinese Optics Letters, Shanghai Institute of Optics and Fine Mechanics, Vol. 15, No. 6 ( 2017), p. 062401-62405
Type of Medium:
Online Resource
ISSN:
1671-7694
Uniform Title:
Optical rectification and Pockels effect as a method to detect the properties of Si surfaces
DOI:
10.3788/COL/2017/15/6
DOI:
10.3788/COL201715.062401
Language:
English
,
Chinese
Publisher:
Shanghai Institute of Optics and Fine Mechanics
Publication Date:
2017