In:
Chinese Optics Letters, Shanghai Institute of Optics and Fine Mechanics, Vol. 22, No. 3 ( 2024), p. 031701-
Type of Medium:
Online Resource
ISSN:
1671-7694
Uniform Title:
Stimulated emission–depletion-based point-scanning structured illumination microscopy
DOI:
10.3788/COL/2024/22/3
DOI:
10.3788/COL202422.031701
Language:
English
,
Chinese
Publisher:
Shanghai Institute of Optics and Fine Mechanics
Publication Date:
2024