In:
ACTA PHOTONICA SINICA, Shanghai Institute of Optics and Fine Mechanics, Vol. 48, No. 9 ( 2019), p. 911004-
Type of Medium:
Online Resource
ISSN:
1004-4213
Uniform Title:
基于扫描白光干涉法的LCOS芯片像素级相位分析
DOI:
10.3788/gzxb/2019/48/9
DOI:
10.3788/gzxb20194809.0911004
Language:
English
,
Chinese
Publisher:
Shanghai Institute of Optics and Fine Mechanics
Publication Date:
2019