In:
Solid State Phenomena, Trans Tech Publications, Ltd., Vol. 215 ( 2014-4), p. 259-263
Abstract:
Morphology and structure of the interface in Ni/Ge thin films being due to the mutual diffusion of these elements are investigated with the help of atomic force microscope, high resolution electron microscope and micro-diffraction. Strong effect of interface in magnetic behavior of Ni layers is demonstrated and explained by formation of magnetic order in the interface and rough boundaries between layers.
Type of Medium:
Online Resource
ISSN:
1662-9779
DOI:
10.4028/www.scientific.net/SSP.215
DOI:
10.4028/www.scientific.net/SSP.215.259
Language:
Unknown
Publisher:
Trans Tech Publications, Ltd.
Publication Date:
2014
detail.hit.zdb_id:
2051138-3