In:
Solid State Phenomena, Trans Tech Publications, Ltd., Vol. 233-234 ( 2015-7), p. 686-689
Abstract:
Amorphous Со-Р and Co-Ni-P films fabricated by chemical deposition under the same conditions are investigated. It is demonstrated that the phosphorous content in the Co-Ni-P exceeds that in the Со-Р films by 1.5−2%. The atomic force microscopy analysis of the surface morphology shows that incorporation of Ni atoms in the Со−Р alloy leads to coarsening of grains due to the higher rate of deposition of Ni atoms as compared with the rate of deposition of Со atoms. The reduction of the dispersion of the polar Kerr effect saturation field in the Со-Ni-P films is attributed to ordering of Сo-Ni atomic pairs.
Type of Medium:
Online Resource
ISSN:
1662-9779
DOI:
10.4028/www.scientific.net/SSP.233-234
DOI:
10.4028/www.scientific.net/SSP.233-234.686
Language:
Unknown
Publisher:
Trans Tech Publications, Ltd.
Publication Date:
2015
detail.hit.zdb_id:
2051138-3