UID:
almafu_9958129948302883
Format:
1 online resource (289 p.)
ISBN:
1-299-36497-7
,
0-323-15754-8
Content:
Excited State Lifetime Measurements
Note:
Based on a series of lectures presented at the University of New Mexico, spring, 1967.
,
Front Cover; Excited State Lifetime Measurements; Copyright Page; Table of Contents; Preface; Chapter 1. Applications; A. Introduction; B. Analytical Chemistry; C. Molecular Yardstick; D. Molecular Dynamics; E. Molecular Structure; F. Thermometers and Miscellaneous Items; G. Assignment of Excited State Types; H. Micelle Composition; I. Excited State Acid-Base Reactions and Tautomerization; J. Solvent Relaxation; K. Solar Energy Conversion; L. Conventions; Chapter 2. Methods of Measuring Lifetimes; A. Introduction; B. Luminescence Methods; C. Flash Photolysis; D. Picosecond Techniques
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E. Miscellaneous MethodsChapter 3. Simple Systems; A. Introduction; B. First-Order Decays; C. Mean Life and Half-Life; D. Step Excitation; E. Quenching and Luminescence Quantum Yields; F. Bimolecular Quenching and the Stern-Volmer Law; G. Multicomponent Decays; Chapter 4. More Complex Systems; A. Introduction; B. Arbitrary Excitation Functions; C. Successive First-Order Decays; D. Phase Shift Measurements of Lifetimes; E. Static or Associational Quenching; F. Resonance Energy Transfer; G. Coupled Systems; H. Steady State Approximation and Excited State Equilibria
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Chapter 5. Least Squares Data ReductionA. Statement of the Least Squares Method; B. Linearizable Complex Functions; C. Least Squares with Weighting Factors; D. Nonlinear Least Squares; E. Judging the Fit; F. Error Estimation; G. Fast Iterative Exponential Evaluation; H. Testing and Applications of Nonlinear Least Squares; Chapter 6. Convolution Integrals; A. Introduction; B. Development of the Convolution Integral; C. Treatment of Specific Systems by Convolution; D. Fast Iterative Convolution Formula; Chapter 7. Real Detection Systems (and Does It Matter?); A. Real Detection Systems
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B. Linear Distortions and DeconvolutionsC. RC Time Constant Effects; D. A Special Warning on the Measurement of Rise Times; Chapter 8. Deconvolution Methods; A. Introduction; B. Simple Curve Matching; C. Analog Computation; D. Phase Plane Method; E. Methods of Moments; F. Laplace and Fourier Transform Methods; G. Least Squares Fitting; H. Comparison of Deconvolution Methods; Chapter 9. Experimental Methods; A. Introduction; B. Light Sources; C. Optical Detectors; D. Optical Modulators; E. Single-Photon Counting Instrumentation; F. Phase Shift Methods; G. Time-Resolved Spectroscopy
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H. Transient Recorders and Signal AveragersI. Microcomputers; Chapter 10. Special Error Sources; A. Introduction; B. Wavelength Effects in Phototubes; C. Photomultiplier Positional Effects; D. Sample Physical Placement; E. Cables and Terminations; F. Electromagnetic Interference (EMI); G. Self-Absorption Errors; H. Compensation for Variations in Flash Profile; I. Triggering Problems; J. Pileup Problems in Single-Photon Counting; K. Purity Problems; Chapter 11. Testing and Evaluation of Methods and Instruments; A. Introduction; B. Digital Simulations; C. Generating Synthetic Noise
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D. Testing Synthetic Noise
,
English
Additional Edition:
ISBN 0-12-208920-0
Language:
English
