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    UID:
    almafu_9960073337802883
    Format: 1 online resource (xxiv, 456 pages) : , illustrations (some color)
    ISBN: 9780081013212 , 0081013213 , 9780124045927 , 0124045928
    Series Statement: Gale eBooks
    Content: This book is the first to give an introduction to microwave de-embedding, showing how it is the cornerstone for waveform engineering. The authors of each chapter clearly explain the theoretical concepts, providing a foundation that supports linear and non-linear measurements, modelling and circuit design. Recent developments and future trends in the field are covered throughout, including successful strategies for low-noise and power amplifier design. This book is a must-have for those wishing to understand the full potential of the microwave de-embedding concept to achieve successful resul
    Note: Description based upon print version of record. , Front Cover; La Clairvoyance; Microwave De-embedding: From Theory to Applications; Copyright; Contents; Foreword; Foreword; About the Editors; Authors' Biographies; Authors; Chapter 1 - A Clear-Cut Introduction to the De-embedding Concept: Less is More; 1.1 Introduction; 1.2 Microwave measurements; 1.3 Microwave modeling; 1.4 From de-embedding to waveform engineering; 1.5 De-embedding: experimental results; Acknowledgments; References; Chapter 2 - Millimeter-Wave Characterization of Silicon Devices under Small-Signal Regime: Instruments and Measurement Meth ...; 2.1 Preliminary concepts , 2.2 On-wafer mm-wave instruments and setup2.3 Calibration and de-embedding procedures for on-wafer measurements; 2.4 Applications: advanced silicon MOSFETs and HBTs; Acknowledgments; References; Chapter 3 - Characterization and Modeling of High-Frequency Active Devices Oriented to High-Sensitivity Subsystems Design; 3.1 Introduction; 3.2 High-frequency noise measurement benches; 3.3 From noise power to noise parameters computation and modeling; 3.4 Measurement errors; 3.5 High-sensitivity subsystems design; References , Chapter 4 - High-Frequency and Microwave Electromagnetic Analysis Calibration and De-embedding4.1 Introduction; 4.2 Double-delay calibration; 4.3 Multiple coupled port calibration and de-embedding; 4.4 Short-open calibration; 4.5 Local ground and internal port de-embedding; 4.6 Circuit subdivision and port tuning: application of calibrated ports; References; Chapter 5 - Large-Signal Time-Domain Waveform-Based Transistor Modeling; 5.1 Introduction; 5.2 Large-signal transistor modeling: overview; 5.3 Modeling currents (I-V) and charges (Q-V): procedure , 5.4 Time-domain waveform-based models extractionAcknowledgments; References; Chapter 6 - Measuring and Characterizing Nonlinear Radio-Frequency Systems; 6.1 Introduction; 6.2 Measuring the nonlinear behavior of an RF system; 6.3 Best linear approximation and nonlinear in-band distortions; 6.4 Out-of-band best linear approximation; 6.5 Compensating nonlinear out-of-band distortions; Acknowledgments; References; Chapter 7 - Behavioral Models for Microwave Circuit Design; 7.1 Introduction; 7.2 Behavioral modeling tools; 7.3 Embedding and de-embedding behavioral models; References , Chapter 8 - Electromagnetic-Analysis-Based Transistor De-embedding and Related Radio-Frequency Amplifier Design8.1 Introduction; 8.2 Electromagnetic analysis of MMIC transistor layout; 8.3 Transistor modeling based on a distributed parasitic network description; 8.4 Full-wave EM analysis for transistor equivalent circuit parasitic element extraction; 8.5 Examples of application to MMIC design; 8.6 De-embedding for bare-die transistor; 8.7 Bare-die transistor modeling and power amplifier design; References; Chapter 9 - Nonlinear Embedding and De-embedding: Theory and Applications , 9.1 Introduction , English
    Additional Edition: ISBN 9780124017009
    Additional Edition: ISBN 0124017002
    Additional Edition: ISBN 9781306133166
    Additional Edition: ISBN 1306133165
    Language: English
    Subjects: Engineering
    RVK:
    RVK:
    URL: Volltext  (URL des Erstveröffentlichers)
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