UID:
almafu_9960073436502883
Format:
1 online resource (565 p.)
ISBN:
1-281-76852-9
,
9786611768522
,
0-08-086007-9
Series Statement:
Methods of experimental physics ; v. 22
Content:
Solid State Physics
Note:
Description based upon print version of record.
,
Front Cover; Solid State Physics: Surfaces; Copyright Page; CONTENTS; Contributors; Foreword; Preface; List of Volume in Treatise; Chapter 1. Work Function Measurements; 1.1. Introduction; 1.2. Work Function Theory; 1.3. Electron Emission Methods; 1.4. Retarding-Potential Methods; 1.5. Capacitance Methods; 1.6. Comparison of the Various Measuring Techniques; 1.7. Experimental Embodiments of the Various Techniques; 1.8. The Future of Work Function Measurements; Chapter 2. Vibrations in Overlayers; 2.1. Introduction; 2.2. Electron Energy Loss Spectroscopy; 2.3. Reflection IR Spectroscopy
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2.4. Inelastic Electron Tunneling Spectroscopy2.5. Conclusions; Chapter 3. Photoemission Spectroscopy of Valence States; 3.1. Introduction: Three-Step Model, Escape Depth, Relevant Parameters; 3.2. Instrumentation; 3.3. Conventional Photoemission; 3.4. Polarized-Photon Photoemission; 3.5. Angle-Resolved Photoemission: The Band-Mapping Technique; 3.6. Synchrotron Radiation Techniques; 3.7. Conclusions and Future Prospects; Chapter 4. Core-Level Spectroscopies; 4.1. Introduction; 4.2. The Core-Level Structure of Atoms; 4.3. The Interaction of Electrons with a Solid
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4.4. Appearance-Potential Spectroscopy4.5. X-Ray Photoelectron Spectroscopy; 4.6. Comparison of Binding Energy Measurements; 4.7. Electron-Excited Auger Electron Spectroscopy; 4.8. Extended Fine Structure Analysis of Surfaces; Chapter 5. Diffraction Techniques; 5.1. Introduction; 5.2. Elements of Diffraction Theory; 5.3. The Measurement of Diffracted-Intensity Distributions; 5.4. Surface Crystallography Measurements; 5.5. Instrumentation and Sample Preparation; 5.6. Representative Experimental Results; 5.7. Conclusions; Chapter 6. Ion Scattering and Secondary-Ion Mass Spectrometry
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6.1. Ion Scattering Spectrometry6.2. Secondary-Ion Mass Spectrometry; 6.3. Synopsis; Chapter 7. High-Field Techniques; 7.1. Field-Electron-Emission Microscopy; 7.2. Applications of Field-Electron-Emission Microscopy; 7.3. Field-Ion Microscopy; 7.4. Field Evaporation; 7.5. Field-Ion Mass Spectroscopy; 7.6. Atom-Probe Mass Spectroscopy; 7.7. Field-Desorption Microscopy; 7.8. Molecular Imaging with Ions; Chapter 8. The Thermal Desorption of Adsorbed Species; 8.1. Introduction; 8.2. Early Studies of Desorption from Polycrystalline Substrates; 8.3. Thermal Desorption from Single Crystals
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8.4. Treatment of Experimental Desorption Data8.5. Theories of Thermal Desorption; 8.6. Concluding Remarks; Chapter 9. Experimental Methods in Electron- and Photon-Stimulated Desorption; 9.1. Theory and Mechanisms of Electron-Stimulated Desorption and the Relationship between ESD and PSD; 9.2. Experimental Methods in ESD and PSD; 9.3. Conclusions; Author Index; Subject Index
,
English
Additional Edition:
ISBN 0-12-475964-5
Language:
English
