UID:
almahu_9947923369302882
Umfang:
VI, 186 p.
,
online resource.
ISBN:
9783540389101
Serie:
Lecture Notes in Physics, 204
Anmerkung:
A brief background of the present requirement for structural characterization of disordered materials -- Fundamental relationships between rdf and scattering intensity -- Definition of partial structure factors and compositional short range order (CSRO) -- Experimental determination of partial structural functions -- Nature of anomalous x-ray scattering and its application for structural analysis of disordered materials -- Theoretical aspects on the anomalous dispersion factors of x-rays -- Experimental determination of the anomalous dispersion factors -- Selected examples of structural determination using anomalous (resonance) x-ray scattering -- Relative merits of anomalous x-ray scattering and its future prospects.
In:
Springer eBooks
Weitere Ausg.:
Printed edition: ISBN 9783540133599
Sprache:
Englisch
URL:
http://dx.doi.org/10.1007/BFb0025745