UID:
almahu_9947983648602882
Format:
X, 204 p.
,
online resource.
ISBN:
9783540399865
Series Statement:
Springer Tracts in Modern Physics, 199
Content:
This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.
Note:
A Brief Introduction to the Topic -- Basic Principles of X-Ray Diffuse Scattering on Mesoscopic Structures -- Experimental Optimization -- A Model System: LPE SiGe/Si(001) Islands -- Dynamical Scattering at Grazing Incidence -- Characterization of Quantum Dots -- Characterization of Interface Roughness -- Appendix.
In:
Springer eBooks
Additional Edition:
Printed edition: ISBN 9783642057694
Additional Edition:
Printed edition: ISBN 9783540201793
Additional Edition:
Printed edition: ISBN 9783662145593
Language:
English
URL:
https://doi.org/10.1007/b13608
