UID:
almahu_9948697872402882
Format:
1 online resource (xix, 394 pages)
Content:
Proceedings of the November 1995 conference, presenting research on electronics testing issues. Topics include systems test; analysis techniques; diagnosis; fault simulation; mixed-signal test; design for testability; education and research in testing; testability measures; ATPG; BIST; self-checking circuits; delay test; technology-specific test; and design specific test. No index. Annotation copyright by Book News, Inc., Portland, OR.
Note:
Bibliographic Level Mode of Issuance: Monograph
,
English
Additional Edition:
ISBN 0-8186-7129-7
Language:
English
