UID:
almahu_9949199235202882
Format:
IX, 241 p.
,
online resource.
Edition:
1st ed. 2002.
ISBN:
9781461507376
Note:
Quantum Nondemolition Measurements of a Qubit -- Bayesian Quantum Measurement of a Single-Cooper-Pair Qubit -- 1/f Noise in Josephson Qubits -- Switching Currents and Quasi-Particle Poisoning in the Superconducting Single Electron Transistor -- Josephson Systems for Quantum Coherence Experiments -- Solid State Analogue of Double Slit Interferometer -- Noise and Microwave Properties of SET-Transistors -- Use of Small Tunnel Junctions Operating at T = 0.3 K -- A Hysteric Single Cooper Pair Transistor for Single Shot Reading of a Charge-Qubit -- Single Cooper Pair Electrometer Based on a Radio-Frequency-SQUID Scheme -- Possibility of Single-Electron Devices and Superconducting Coherence -- Frequency-Locked Current of Cooper Pairs in Superconducting Single Electron Transistor with Ohmic Resistor -- Setup for Experiments on the Supercurrent-Phase Relation in Bloch Transistors-Status and Possible Applications -- Single-Electron Transistors in the Regime of High Conductance -- Superconducting Transistor-Edge Sensors for Time & Energy Resolved Single-Photon Counters and for Dark Matter Searches -- Optimization of the Hot-Electron Bolometer and a Cascade Quasiparticle -- Noise in Refrigerating Tunnel Junctions and in Microbolometers -- Nonequilibrium Quasiparticles and Electron Cooling by Normal Metal-Superconductor Tunnel Junctions -- Mesoscopic Josephson Junctions Coupled to Weak Coherent Fields: An Example of Reciprocal Detection -- Dynamics of Superconducting Interferometers Containing Pi-Junctions -- Superconducting Current-Phase Dependence on High-Tc Symmetrical Bicrystal Junctions -- Superconducting Quantum Detector for Astronomy and X-Ray Spectroscopy -- Lifetime of Even-Parity States of a Bloch Transistor -- Magnetic Field Dependence of Retrapping Currents in DC-SQUIDs -- Josephson versus Kondo Coupling at a Quantum Dot with Superconducting Contacts.
In:
Springer Nature eBook
Additional Edition:
Printed edition: ISBN 9780306472664
Additional Edition:
Printed edition: ISBN 9781461352174
Additional Edition:
Printed edition: ISBN 9781461507383
Language:
English
DOI:
10.1007/978-1-4615-0737-6
URL:
https://doi.org/10.1007/978-1-4615-0737-6
