UID:
almahu_9949420920102882
Format:
1 online resource (various pagings) :
,
illustrations (some color).
ISBN:
9780750332354
,
9780750332347
Series Statement:
[IOP release $release]
Content:
This book explores the operating principles of complementary metal oxide semiconductor (CMOS) image sensors, their architecture, readout circuits, and characterisation techniques.
Note:
"Version: 20221201"--Title page verso.
,
1. The fundamentals -- 1.1. Introduction--what is an image sensor and what does it do? -- 1.2. Charge generation -- 1.3. Charge collection -- 1.4. Charge transfer -- 1.5. Charge conversion -- 1.6. pn junction -- 1.7. MOS capacitor -- 1.8. MOS transistor -- 1.9. Source follower
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2. CMOS pixel architectures -- 2.1. History and technology -- 2.2. Photodiode APS -- 2.3. Pinned photodiode (4T) -- 2.4. Other PPD-based pixels -- 2.5. Hybrid and 3D image sensors
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3. Advanced image sensor topics -- 3.1. Photocurrent -- 3.2. Dark current -- 3.3. Reflective barrier -- 3.4. Back-side illumination -- 3.5. Depletion depth and potential gradients -- 3.6. Punch-through -- 3.7. Field-induced junctions
,
4. Noise and readout techniques -- 4.1. Noise in image sensors -- 4.2. Correlated double sampling
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5. Characterisation -- 5.1. Introduction -- 5.2. Readout modes -- 5.3. Principles of EO characterisation -- 5.4. Photoresponse, non-uniformity and nonlinearity -- 5.5. Photon transfer curve -- 5.6. X-ray calibration -- 5.7. Full well capacity and dynamic range -- 5.8. Dark current and DSNU -- 5.9. Noise measurement -- 5.10. Image lag -- 5.11. Quantum efficiency -- 5.12. Electrical transfer function
,
6. Electronics -- 6.1. On-chip electronics -- 6.2. Off-chip electronics.
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Also available in print.
,
Mode of access: World Wide Web.
,
System requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader.
Additional Edition:
Print version: ISBN 9780750332330
Additional Edition:
ISBN 9780750332361
Language:
English
DOI:
10.1088/978-0-7503-3235-4
URL:
https://iopscience.iop.org/book/mono/978-0-7503-3235-4
