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Book

Scanning electron microscopy and x-ray microanalysis / (2003)

Goldstein, Joseph, 1939-2015

New York [u.a.] :Kluwer Academic/Plenum Publishers,

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Details

UID:

almahu_BV036551378

Format: XIX, 689 S. : , Ill., graph. Darst.

Edition: 3. ed.

ISBN: 978-0-306-47292-3 , 0-306-47292-9

Note: Includes bibliographical references and index

Language: English

Subjects: Chemistry/Pharmacy , Physics

RVK:

UH 6310

RVK:

UH 6320

RVK:

VG 9900

Keywords: Rasterelektronenmikroskopie ; Elektronenstrahlmikroanalyse ; Elektronenstrahlmikroanalyse ; Werkstoff ; Raster-Transmissions-Elektronenmikroskopie ; CD-ROM

URL: Cover

URL: http://www.loc.gov/catdir/enhancements/fy0813/2002028276-d.html

URL: Cover

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