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Book

Lyu, Michael R. [Sonstige]

Los Alamitos, Calif. [u.a.] : IEEE Computer Soc. Press [u.a.]

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Details

UID:

b3kat_BV010769228

Format: XXV, 850 S. , graph. Darst. , 1 CD-ROM ; 12 cm

ISBN: 0070394008

Series Statement: Computing McGraw-Hill

Note: Nebent.: Software reliability engineering

Language: English

Subjects: Computer Science

RVK:

ST 233

RVK:

ST 277

Keywords: Softwaremetrie ; Zuverlässigkeit ; Software

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