Umfang:
1 Online-Ressource (XIV, 529 p)
Ausgabe:
Second Completely Revised and Updated Edition
ISBN:
9783540389675
,
9783642083723
Serie:
Springer Series in Optical Sciences 45
Anmerkung:
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information
Weitere Ausg.:
Erscheint auch als Druck-Ausgabe ISBN 3-540-63976-4
Sprache:
Englisch
Fachgebiete:
Physik
Schlagwort(e):
Rasterelektronenmikroskopie
DOI:
10.1007/978-3-540-38967-5
