Format:
1 Online-Ressource (XII, 521 p)
ISBN:
9783662135532
,
9783662135556
Series Statement:
Springer Series in Optical Sciences 36
Note:
The aim of this book is to outline the physics of image formation, electron specimen interactions and image interpretation in transmission electron microscopy. The book evolved from lectures delivered at the University of Munster and is a revised version of the first part of my earlier book Elektronenmikroskopische Untersuchungs- und Präparationsmethoden, omitting the part which describes specimen-preparation methods. In the introductory chapter, the different types of electron microscope are compared, the various electron-specimen interactions and their applications are summarized and the most important aspects of high-resolution, analytical and high-voltage electron microscopy are discussed. The optics of electron lenses is discussed in Chapter 2 in order to bring out electron-lens properties that are important for an understanding of the function of an electron microscope. In Chapter 3, the wave optics of electrons and the phase shifts by electrostatic and magnetic fields are introduced; Fresnel electron diffraction is treated using Huygens' principle. The recognition that the Fraunhofer-diffraction pattern is the Fourier transform of the wave amplitude behind a specimen is important because the influence of the imaging process on the contrast transfer of spatial frequencies can be described by introducing phase shifts and envelopes in the Fourier plane. In Chapter 4, the elements of an electron-optical column are described: the electron gun, the condenser and the imaging system. A thorough understanding of electron-specimen interactions is essential to explain image contrast
Additional Edition:
Erscheint auch als Druck-Ausgabe ISBN 3-540-11794-6
Language:
English
Subjects:
Physics
Keywords:
Durchstrahlungselektronenmikroskopie
;
Elektron
;
Physik
;
Beugung
;
Mikroanalyse
;
Kristallstruktur
;
Elektronenmikroskopie
DOI:
10.1007/978-3-662-13553-2
