UID:
edocfu_9958354034202883
Format:
1 online resource(xi,334p.) :
,
illustrations.
Edition:
Electronic reproduction. Berlin : De Gruyter, 2014. Mode of access: World Wide Web.
Edition:
System requirements: Web browser.
Edition:
Access may be restricted to users at subscribing institutions.
ISBN:
9783110308280
Content:
This completely revised edition is a guide for practical work in X-ray analysis. Experimental developments e.g. brilliant X-ray sources, area detection, and developments in computer hardware and software have led to increasing applications in X-ray analysis. An introduction to basic crystallography moves quickly to a practical and experimental treatment of structure analysis. Essential reading from the student to the professional level.
Note:
Frontmatter --
,
Preface to the 1st edition --
,
Preface to the 2nd edition /
,
Contents --
,
1. Introduction --
,
2. Fundamental results of diffraction theory, X-radiation --
,
3. Preliminary experiments --
,
4. Crystal symmetry --
,
5. Diffractometer measurements --
,
6. Computer programs --
,
7. Solution of the phase problem --
,
8. Refinements --
,
9. Structure analysis at non-routine conditions --
,
10. Concluding remarks and outlook --
,
Appendix: Mathematics --
,
Bibliography --
,
Index.
,
Also available in print edition.
,
In English
Additional Edition:
ISBN 9783110308235
Additional Edition:
ISBN 9783110308297
Language:
English
DOI:
10.1515/9783110308280
URL:
https://doi.org/10.1515/9783110308280
