UID:
edocfu_9959229256402883
Format:
1 online resource (180 p.)
Edition:
1st ed.
ISBN:
1-5231-0054-0
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3-11-038804-9
Content:
High-resolution electron microscopy allows the imaging of the crystallographic structure of a sample at an atomic scale. It is a valuable tool to study nanoscale properties of crystalline materials such as superconductors, semiconductors, solar cells, zeolite materials, carbon nanomaterials or BN nanotubes.
Note:
Description based upon print version of record.
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Front matter --
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Preface --
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Contents --
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1 Introduction --
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2 Structure and principle of electron microscopes --
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3 Practice of HREM --
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4 Characterization by HREM --
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5 Electron diffraction analysis of nanostructured materials --
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6 HREM analysis of nanostructured materials --
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A Appendix --
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Index
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English
Additional Edition:
ISBN 3-11-030501-1
Additional Edition:
ISBN 3-11-030472-4
Language:
English
DOI:
10.1515/9783110305012
