Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    UID:
    almafu_9960112855602883
    Format: 1 online resource (474 p.)
    Edition: Reprint 2021
    ISBN: 9783112495643
    Series Statement: Physica status solidi / A. ; Volume 109, Number 1
    Note: Frontmatter -- , Author Index -- , Physica status solidi (a) applied research -- , Contents -- , Review Article -- , Orientation and Strain in Heteroepitaxial Growth -- , Original Papers and Short Notes -- , Structure; crystallography -- , Crystallization of Metallic Glass Fe 46 N 31 VSi 8 B 14 -- , Contrast of Small SiX Particles in Silicon by Computed HREM Images -- , Icosahedral Phases in the Al-Fe-Cr Alloy System -- , Trial Model for the Tilting Scheme in AgNbO3 Derived by Electron Diffraction and Imaging -- , Anisotropie Deformation of a Crystal Plate and Its Analysis with X-Ray Diffraction Methods -- , Interaction of Anti-Site Defects with Ge Impurity Atoms in Sb2Te3 Single Crystals -- , X-Ray Reflection from and Transmission through a Plane-Parallel Dielectric Plate with Cosine-Like Polarizability (Symmetrical Laue Case) -- , Etude structurale, par diffraction de R-X, des liaisons dans les semiconducteurs ternaires ZnSiAs2, ZnGeAs2 et ZnSnAs 2 -- , A New Approach for n-beam Lattice Image Calculation -- , Defects; nonelectronic transport -- , Accumulation and Transformation of Radiation Defects in Silicon under Different Doses and Intensities of Electron Irradiation -- , Study of the Movement of Oxygen Vacancies in the Orthorhombic Phase of YBa2Cu3O 7-x by Positron Doppler Broadening Spectroscopy -- , Redistribution of Boron in Silicon by High-Temperature Irradiation with Heavy Ions -- , Dislocation Groups, Multipoles, and Friction Stresses in a-CuZn Alloys -- , Lattice properties -- , Deformation Mechanism Maps and Gettering Diagrams for Single-Crystal Silicon -- , TEM Study of Phases and Domains in NaNbO3 at Room Temperature -- , Low Temperature Plasticity of Brittle Materials -- , EPR Study of SO 4 Radicals in K4LiH3(SO4)4 Crystals -- , X-Ray Analysis of Residual Stress State with Variable Components of Stress Tensor -- , Surfaces, interfaces, thin films; lower-dimensional systems -- , The Complex AC Susceptibility of Superconducting Y-Bar-CuO Thin Film and Bulk Samples -- , The Current Characteristics of p-i-n and p+-i-p+ Structures Based on Hydrogenated Amorphous Silicon at Various Temperatures and Excitation Levels -- , A Reinvestigation of Ni2Si Thin Film Growth on Si(lll) by TEM and RBS -- , Structural Analysis of Silicon Doped with High Doses of C+ Ions -- , Protective Coatings on GaAs and InP -- , Transient Photocurrents in a-Si:H Diodes: Effects of Deep Trapping -- , Mechanism of Voltage Generation in Bi Films Due to Laser Irradiation -- , Determination of Semiconductor Parameters by Electron Beam Induced Current and Cathodoluminescence Measurements -- , Localized electronic states -- , Silver Related Deep Levels in Silicon -- , DLTS Study of Deep Level Defects in Cz n-Si Due to Heat Treatment at 600 to 900 °C -- , Investigation of the Oxygen Vacancy Balance in ZnO Ceramics by Means of EPR -- , Electronic transport; superconductivity -- , The Internal Strain Effect on T0 in the Y-Ba-Al-Cu Oxide Superconductor -- , Magnetic properties; resonances -- , Low-Temperature Magnetic Transformations in Ferrous Fluorsilicate Induced by Pressure -- , On the Influence of Internal Stress and Magnetizing Frequency on Domain Wall Motion in High-Purity Ni -- , Cluster Structure of the Li-Ti-Zn Ferrite System Studied by Neutron Scattering -- , Dielectric and optical properties -- , The Indirect Allowed Optical Transitions in (Ga 0.3 In 0.7)2 Se 3 -- , Positron Annihilation Studies in Non-Metallic Solids: d-Camphor and Silver Iodide -- , Nonlinear I-U Characteristics and Photoelectret State in Sillenite-Type Crystals -- , Computer Simulation Experiment on the mm-Wave Properties of Indium Phosphide Double Drift Impatts -- , Short Notes -- , A Special Metastable Phase of Metallic Glass Pd 77.5 Ni 6 Si 16.5 -- , SEM-EBIC Investigations of Grain Boundaries in Cadmium Telluride -- , Detection of the Active Layer of A III B V Semiconductor Quantum-Well Structures by High Resolution X-Ray Diffractometry -- , Structure and Properties of Implanted Steels -- , A/2 〈 110〉 Dislocations at the y/y' Interface in a Ni-Based Superalloy -- , Two Trapping Centers in the Photoplastic Effect in CdS -- , Ru-Metal Segregation in Borosilicate Glasses -- , Melting of Multilayered Structures under Pulse Heating (Computational Experiment) -- , Non-Equilibrium Gradient-Zone Crystallization in Semiconductors -- , Contact Resistance Reduction by Implanted n+ -Layers at the Ni/AuGe- GaAs System -- , IR and ESR Studies of the Structural Properties of Hydrogenated Amorphous Carbon Films -- , Electron Microscopy and Optical Studies of Chemically Deposited CuInS2 Thin Films -- , Electrical Activity Peculiarities of Tin and Iron Impurities in the Semiconducting Glass Ge 28.5 Pb 15S 56.5 -- , Photoconductivity and Luminescence Spectra of ZnIn2S4 Crystals Irradiated by y-Quanta -- , NMR-Spectroscopy Study of Ca(Cu 30-x Mn x )Mn 4 O 12 Perovskites -- , Magnetization in Films with Modulated Surfaces -- , Magnetic Properties of UCuGe -- , On the Stress Dependence of the Saturation Magnetostriction in Amorphous Alloys -- , Effect of Thickness and Length of the Sample on the Dielectric Constant (e') and Loss (e") Measurements in the Microwave Cavity Perturbation Technique -- , Thermally Stimulated Electron Emission from Triglycine Sulphate Crystals Excited by AC Electric Field -- , Pre-Printed Titles -- , Pre-Printed Titles of papers to be published in the next issues of physica status solidi (a) and physica status solidi (b) -- , Substance Classification -- , Backmatter , In English.
    Additional Edition: ISBN 9783112495636
    Language: English
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
Close ⊗
This website uses cookies and the analysis tool Matomo. Further information can be found on the KOBV privacy pages