ISSN:
1435-8115
Note:
Konferenz: 18th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, DRIP XVIII, Berlin, September, 8-12, 2019
In:
Microscopy and microanalysis, Oxford : Oxford University Press, 1995, 22(2019), S3, Seite 602-603, 1435-8115
In:
volume:22
In:
year:2019
In:
supplement:S3
In:
pages:602-603
Language:
English
DOI:
10.1017/S143192761600386X
URL:
https://doi.org/10.1017/S143192761600386X