Format:
1 online resource (606 pages)
ISBN:
9783030520175
Series Statement:
Embedded Systems Ser.
Content:
Intro -- Preface -- Fabrication and Design-Time Effects -- Yield and Process Variations -- Complexity -- Operation and Run-Time Effects -- Aging Effects -- Thermal Effects -- Soft Errors -- Contents -- RAP Model-Enabling Cross-Layer Analysis and Optimization for System-on-Chip Resilience -- 1 Introduction/Motivation -- 2 Resilience Articulation Point (RAP) Basics -- 3 Related Work -- 4 Fault Abstraction at Lower Levels -- 4.1 SRAM Errors -- 4.1.1 SRAM Errors due to Particle Strikes (Qcrit) -- 4.1.2 SRAM Errors due to Noise (SVNM) -- 4.1.3 SRAM Errors Due to Read/Write Failures (Read Delay/WTV) -- 4.1.4 SRAM Errors due to Supply Voltage Drop -- 5 Architecture Level Analysis and Countermeasures -- 5.1 Instruction Vulnerability -- 5.2 Data Vulnerability Analysis and Mitigation -- 5.3 Dynamic Testing -- 6 Application-Level Optimization-Autonomous Robot -- References -- Part I Cross-Layer from Operating System to Application -- Soft Error Handling for Embedded Systems using Compiler-OS Interaction -- 1 New Requirements for Fault Tolerance -- 2 Semantics of Errors -- 3 FEHLER System Overview and Semantic Annotations -- 4 Timing Behavior -- 5 Static Analyses -- 6 FEHLER Runtime System -- 7 Use Case: A Fault-Tolerant QoS-Aware Soft Real-time Application -- 8 Use Case: Adaptive Error Handling in Control Applications -- 9 Application of FEHLER to Approximate Computing -- 10 Summary and Outlook -- References -- ASTEROID and the Replica-Aware Co-schedulingfor Mixed-Criticality -- 1 The ASTEROID Project -- 1.1 Motivation -- 1.2 Overview -- 2 Replica-Aware Co-scheduling for Mixed-Criticality -- 2.1 Motivation -- 2.2 Related Work -- 3 System, Task, and Error Models -- 3.1 System Model -- 3.2 Task Model -- 3.3 Error Model -- 3.4 Offsets -- 4 Response-Time Analysis -- 4.1 Fork-Join Tasks -- 4.2 Independent Tasks -- 4.3 Error Recovery -- 5 Experimental Evaluation.
Note:
Description based on publisher supplied metadata and other sources
Additional Edition:
ISBN 9783030520168
Additional Edition:
Erscheint auch als Druck-Ausgabe ISBN 9783030520168
Language:
English
