Format:
Online-Ressource (XIX, 690 p)
,
digital
Edition:
Reproduktion Springer eBook Collection. Chemistry and Materials Science
ISBN:
9781461502159
Content:
This text provides students as well as practitioners (engineers, technicians, physical and biological scientists, clinicians, and technical managers) with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers, the characteristics of electron beam - specimen interactions, image formation and interpretation, the use of x-rays for qualitative and quantitative analysis and the methodology for structural analysis using electron back-scatter diffraction. SEM sample preparation methods for hard materials, polymers, and biological specimens are covered in separate chapters. In addition techniques for the elimination of charging in non-conducting specimens are detailed
Additional Edition:
ISBN 9781461349693
Additional Edition:
Erscheint auch als Druck-Ausgabe ISBN 9781461349693
Additional Edition:
Erscheint auch als Druck-Ausgabe ISBN 9780306472923
Additional Edition:
Erscheint auch als Druck-Ausgabe ISBN 9781461502166
Language:
English
DOI:
10.1007/978-1-4615-0215-9
URL:
Volltext
(lizenzpflichtig)
