Format:
Online-Ressource (1 online resource (644 p.))
,
digital, PDF file(s).
Edition:
Online-Ausg.
ISBN:
9780511534850
Content:
The elucidation of the effects of structurally extended defects on electronic properties of materials is especially important in view of the current advances in electronic device development that involve defect control and engineering at the nanometer level. This book surveys the properties, effects, roles and characterization of extended defects in semiconductors. The basic properties of extended defects (dislocations, stacking faults, grain boundaries, and precipitates) are outlined, and their effect on the electronic properties of semiconductors, their role in semiconductor devices, and techniques for their characterization are discussed. These topics are among the central issues in the investigation and applications of semiconductors and in the operation of semiconductor devices. The authors preface their treatment with an introduction to semiconductor materials and conclude with a chapter on point defect maldistributions. This text is suitable for advanced undergraduate and graduate students in materials science and engineering, and for those studying semiconductor physics
Content:
1. Semiconducting materials; 2. An introduction to extended defects; 3. Characterization of extended defects in semiconductors; 4. Core structures and mechanical effects of extended defects specific to semiconductors; 5. The electrical, optical and device effects of dislocations and grain boundaries; 6. Point defect materials problems
Note:
Title from publisher's bibliographic system (viewed on 05 Oct 2015)
Additional Edition:
ISBN 9780521819343
Additional Edition:
ISBN 9781107424142
Additional Edition:
Erscheint auch als Druck-Ausgabe Holt, D. B. Extended defects in semiconductors Cambridge [u.a.] : Cambridge Univ. Press, 2007 ISBN 0521819342
Additional Edition:
ISBN 9780521819343
Additional Edition:
Erscheint auch als Druck-Ausgabe ISBN 9780521819343
Language:
English
Subjects:
Physics
Keywords:
Halbleiter
;
Gitterbaufehler
DOI:
10.1017/CBO9780511534850
