Format:
1 Online-Ressource (587 pages)
,
illustrations
Edition:
[S.l.] HathiTrust Digital Library Electronic reproduction
ISBN:
0780326237
,
0780326210
,
0780326229
,
9780780326231
,
9780780326217
,
9780780326224
Note:
"IEEE catalog number 95CH35786"--Title page verso
,
"Systems readiness: Test Technology for the 21st Century
,
Includes bibliographical references and index
,
Use copy Restrictions unspecified star MiAaHDL
,
Electronic reproduction
,
Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
Additional Edition:
Print version Autotestcon (1995 : Atlanta, Ga.) Conference record, Autotestcon '95, August 8-10, 1995 Piscataway, N.J : IEEE Service Center, ©1995
Language:
English
Keywords:
Konferenzschrift
URL:
http://purl.oclc.org/DLF/benchrepro0212