UID:
almafu_9959328309802883
Umfang:
1 online resource (xvii, 336 pages) :
,
illustrations
ISBN:
3527600167
,
9783527600168
Anmerkung:
Title from title screen (viewed Jan. 7, 2004).
,
Electron Detection -- Photoelectron Spectroscopy -- Auger Electron Spectroscopy (AES) / H. Bubert & J. Rivir̈e -- Electron Energy-Loss Spectroscopy (EELS) / R. Schneider -- Low-energy Electron Diffraction (LEED) / G. Held -- Other Electron-detecting Techniques / J. Rivir̈e -- Ion Detection -- Static Secondary Ion Mass Spectrometry (SSIMS) / H. Arlinghaus -- Dynamic Secondary Ion Mass Spectrometry (SIMS) / H. Hutter -- Electron-impact (EI) Secondary Neutral Mass Spectrometry (SNMS) / H. Jenett -- Laser-SNMS / H. Arlinghaus -- Rutherford Back-scattering Spectroscopy (RBS) / L. Palmetshofer -- Low-energy Ion Scattering (LEIS) / P. Bauer -- Elastic Recoil Detection Analysis (ERDA) / O. Benka -- Nuclear Reaction Analysis (NRA) / O. Benka -- Other Ion-detecting Techniques / J. Rivir̈e -- Photon Detection -- Total Reflection X-ray Fluorescence Analysis (TXRF) / L. Fabry & S. Pahlke -- Energy-dispersive X-ray Spectroscopy (EDXS) / R. Schneider -- Grazing Incidence X-ray Methods for Near-surface Structural Studies / P. Gibson -- Glow Discharge Optical Emission Spectroscopy (GD-OES) / A. Quentmeier -- Surface Analysis by Laser Ablation / M. Bolshov -- Ion Beam Spectrochemical Analysis (IBSCA) / V. Rupertus -- Reflection Absorption IR Spectroscopy (RAIRS) / K. Hinrichs -- Surface-enhanced Raman Scattering (SERS) / W. Hill -- UV-Vis-IR Ellipsometry (ELL) / B. Gruska & A. Rs̲eler -- Other Photon-detecting Techniques / J. Rivir̈e -- Scanning Probe Microscopy -- Atomic Force Microscopy (AFM) / G. Friedbacher -- Scanning Tunneling Microscopy (STM) / G. Friedbacher.
Sprache:
Englisch
URL:
https://onlinelibrary.wiley.com/doi/book/10.1002/3527600167
URL:
https://onlinelibrary.wiley.com/doi/book/10.1002/3527600167
URL:
https://onlinelibrary.wiley.com/doi/book/10.1002/3527600167
