UID:
almahu_9949198753002882
Umfang:
XIII, 644 p.
,
online resource.
Ausgabe:
1st ed. 1995.
ISBN:
9789401100496
Serie:
Nato Science Series E:, Applied Sciences, 286
Anmerkung:
to Scanning Probe Methods -- The Nanometer Age: Challenge and Chance -- Instrumentation -- Scanning Probe Microscopy Instrumentation -- Low Temperature Scanning Force Microscopy -- Measuring Ultrafast Voltage Signals Using a Scanning Force Microscope -- Oscillating String as a Force Sensor in Scanning Force Microscopy -- Electrostatically Actuated Silicon Micromachined Sensors for Scanning Force Microscopy -- Effect of Overlayer Thickness on the Nanoindentation of SiO2 /Si -- Nanostethoscopy: a New Mode of Operation of the Atomic Force Microscope -- A Multi-Test Instrument Based on Scanning Probe Technologies -- Hydrophobic Surface Interactions Studied Using a Novel Force Microscope -- Imaging Loal Electric Forces in Organic Thin Films by Scanning Maxwell Stress Microscopy -- Simultaneous AFM and Local Conductivity Imaging -- Micromechanical Heat Sensor: Observation of a Chemical Reaction, Photon and Electrical Heat Pulses -- Theory -- Forces in Scanning Probe Microscopy -- Controlled Motion of Xe Atom on Metal Surfaces -- Van der Waals Forces and Probe Geometeries for Some Specific Scanning Force Microscopy Studies -- Atomistic Theory of the Interaction between AFM Tips and Ionic Surfaces -- Molecular Dynamics Simulation of Atomic-Scale Adhesion, Deformation, Friction, and Modification of Diamond Surfaces -- Simulation of SFM Images of Adsorbed C60 and C70 Molecule -- Metallic Adhesion -- Atomic-Scale Metal Adhesion -- Photons -- Photons and Forces I: Light Generates Force -- Photons and Forces II: Forces Influence Light -- Friction -- Interfacial Friction and Adhesion of Wetted Monolayers -- Coherent Phonon Generation in the Process of Friction -- Friction Force Microscopy -- Molecular Scale Study of Domain Boundaries and Frictional Stick-Slip Motion on Lipid Bilayers -- Two-Dimensional Atomic-Scale Friction Observed with an AFM -- Normal and Lateral Forces in Friction Force Microscopy -- Nanotribology and Chemical Sensitivity on a Nanometer Scale -- Lateral Force Measurements on Phase Separated Polymer Surfaces -- Friction and Load on Well Defined Surfaces Studied by Atomic Force Microscopy -- Friction on an Atomic Scale -- Nano and Micromechanics -- Nanomechanics: Atomic Resolution and Frictional Energy Dissipation in Atomic Force Microscopy -- Nanotribology and its Applications to Magnetic Storage Devices and MEMS -- Lifetime Criteria of Macro- and Microtribological Systems -- Mechanical Property Evaluations of Solid Surfaces as a Technological Application of SPM -- Effects of Boundary Lubricants and Metallic Oxides in Steel-Steel Tribological Junctions Studied with the Atomic Force Microscope -- Magnetic Storage and Magnetic Forces -- High-Density Recording Technologies as an Application of SPM -- Applications of Magnetic Force Microscopy -- Magnetic Force Microscopy on Thin Film Magnetic Recording Media -- Analysis of Vortices in Superconductors by Scanning Probe Microscopy -- Applications -- Understanding Surface Chemical Processes in Environmental Contamination: New Applications for AFM -- Force Microscopy of Heavy Ion Irradiated Materials -- Atomic Force Microscopy as a Tool to Study Surface Roughness Effects In X-Ray Photoelectron Spectroscopy -- Atomic-Resolution Image of GaAs (110) Surface with an Ultrahigh-Vacuum Atomic Force Microscope (UHV-AFM) -- Time dependence and its Spatial Distribution of Densely Contact-Electrified Electrons on a Thin Silicon Oxide -- Giant Atomic Corrugations on Layered Dichalcogenides Investigated by AFM/LFM -- Nanometer Scale Machining of Covalent Monolayers Investigated by Combined AFM/ LFM -- Atomic Resolution Imaging of ReS2 by AFM/LFM -- Ultra-High-Vacuum Atomic Force Microscopy in the Study of Model Catalysts -- AFM in Liquids AFM Observations of Si (111) in Solutions -- Atomic Scale Force Mapping with the Atomic Force Microscope -- Organics and Biology -- Imaging Chemical Bonds by SPM -- Study of Thin Organic Films by Various Scanning Force Microscopes -- Molecular Arrangement and Mechanical Stability of Self-Assembled Monolayers on Au (111) under Applied Load -- Organic Interface Inspection by Scanning Force Microscopy -- Atomic Force Microscopy of Biological Membranes: Current Possibilities and Prospects -- Biomolecule Photoimmobilization: Application in Scanning Probe Microscopy -- Measuring Molecular Adhesion with Force Microscopy -- Author-index -- Subject-index.
In:
Springer Nature eBook
Weitere Ausg.:
Printed edition: ISBN 9789401040273
Weitere Ausg.:
Printed edition: ISBN 9780792334064
Weitere Ausg.:
Printed edition: ISBN 9789401100502
Sprache:
Englisch
DOI:
10.1007/978-94-011-0049-6
URL:
https://doi.org/10.1007/978-94-011-0049-6
