UID:
edocfu_9958354178202883
Umfang:
1 online resource(x,168p.) :
,
illustrations.
Ausgabe:
Electronic reproduction. Berlin/Boston : De Gruyter. Mode of access: World Wide Web.
Ausgabe:
System requirements: Web browser.
Ausgabe:
Access may be restricted to users at subscribing institutions.
ISBN:
9783110305012
Inhalt:
High-resolution electron microscopy allows the imaging of the crystallographic structure of a sample at an atomic scale. It is a valuable tool to study nanoscale properties of crystalline materials such as superconductors, semiconductors, solar cells, zeolite materials, carbon nanomaterials or BN nanotubes.
Anmerkung:
Frontmatter --
,
Preface --
,
Contents --
,
1 Introduction --
,
2 Structure and principle of electron microscopes --
,
3 Practice of HREM --
,
4 Characterization by HREM --
,
5 Electron diffraction analysis of nanostructured materials --
,
6 HREM analysis of nanostructured materials --
,
A Appendix --
,
Index.
,
Also available in print edition.
,
In English.
Weitere Ausg.:
ISBN 9783110304725
Weitere Ausg.:
ISBN 9783110305029
Sprache:
Englisch
DOI:
10.1515/9783110305012
URL:
https://doi.org/10.1515/9783110305012
