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1 Online-Ressource (vii, 71, XIV Seiten, 12245 KB)
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Inhalt:
In this work, two X-ray refraction based imaging methods, namely, synchrotron X-ray refraction radiography (SXRR) and synchrotron X-ray refraction computed tomography (SXRCT), are applied to analyze quantitatively cracks and porosity in metallic materials. SXRR and SXRCT make use of the refraction of X-rays at inner surfaces of the material, e.g., the surfaces of cracks and pores, for image contrast. Both methods are, therefore, sensitive to smaller defects than their absorption based counterparts X-ray radiography and computed tomography. They can detect defects of nanometric size. So far the methods have been applied to the analysis of ceramic materials and fiber reinforced plastics. The analysis of metallic materials requires higher photon energies to achieve sufficient X-ray transmission due to their higher density. This causes smaller refraction angles and, thus, lower image contrast because the refraction index depends on the photon energy. Here, for the first time, a conclusive study is presented exploring the possibility to ...
Anmerkung:
Dissertation Universität Potsdam 2022
Weitere Ausg.:
Erscheint auch als Druck-Ausgabe Laquai, René Extending synchrotron X-ray refraction techniques to the quantitative analysis of metallic materials Potsdam, 2022
Sprache:
Englisch
Schlagwort(e):
Hochschulschrift
DOI:
10.25932/publishup-54183
URN:
urn:nbn:de:kobv:517-opus4-541835
URL:
https://doi.org/10.25932/publishup-54183
URL:
https://nbn-resolving.org/urn:nbn:de:kobv:517-opus4-541835
URL:
https://d-nb.info/1256171328/34
